Boise State Center for Materials Characterization

Overview

 

The Boise State Center for Materials Characterization was established by the Idaho State Board of Education in August 2006 to provide a state-of-the-art characterization facility in order to attract more students into science and engineering careers, to improve science and engineering education at the undergraduate and graduate levels, and to foster leading research and interaction with local industry.  As such, it provides the organization and infrastructure to make various materials characterization tools available for academia and regional companies.

The BSCMC is complimentary to the Microscopy and Characterization Suite (MaCS) at the Center for Advanced Energy Studies (CAES). The MaCS is a state-of-the-art microscopy laboratory and regional resource for materials imaging in support of the CAES mission.

 Services

  • Transmission Electron Microscopy (TEM)
  • Scanning Electron Microscopy (SEM)
  • Elemental Analysis (EDS/WDS/XRF)
  • Electron Probe Microanalysis (EPMA)
  • TEM/SEM sample preperation
  • X-ray Diffraction (XRD)
  • Optical Microscopy

Location and hours of operation

Hours Location

Monday - Friday 8am to 5pm 

Micron Engineering Room 113
Boise State University
1910 University Drive
Boise, ID 83725

Links and Resources

  1. BSCMC Home Page
  2. BSCMC Laboratory Safety Manual
  3. Complete a risk assessment form before handling chemicals in this facility.
  4. iLab Customer Manual
  5. iLab PI Manual

Contacts

Name Role Phone Email Location
Dr. Rick Ubic
Director
 
208-426-2309
 
rickubic@boisestate.edu
 
MEC 302H
 
Dr. Karthik Chinnathambi
Core Manager, Research Engineer
 
208-426-4646
 
karthikchinnathambi@boisestate.edu
 
MEC 112
 
Tarci Hernandez
Lab Assistant
 
208-490-7405
 
tarcihernandez@u.boisestate.edu
 
MEC 113
 
Dr. Nick Bulloss
Research Engineer
 
208-426-5711
 
nicholasbulloss@boisestate.edu
 
MEC112
 

Services

Name Description
Epoxy Mount   
X-Ray Fluorescence Spectrometer (XRF) - Bruker Trace III SD 

Peltier-cooled 10 mm2 SDD
Typical resolution: 145 eV at 100,000 cps
Vacuum pump attachment for enhanced light-element sensitivity
Gas-flow chamber for the measurement of gases down to Ne

 
Bench top X-ray diffractometer XRD 

Priced per scan
Rigaku Miniflex 600 X-ray Diffractometer.

 

One dimensional D/teX Ultra high-speed detector (very quick scans),

Scintillating point detector with graphite monochromator (best for resolution),

Multiple-sample loading capability,

Zero-loss and air-sensitive sample holders.

 
Jet polishing 

Priced per sample
Struers Tenupol-3 Double Jet-polisher 

 
Ion Slicer 

Priced per sample

JEOL Model EM-09100IS Ion Slicer

 

Services


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Equipment Fees (4)
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