Boise State Center for Materials Characterization



The Boise State Center for Materials Characterization was established by the Idaho State Board of Education in August 2006 to provide a state-of-the-art characterization facility in order to attract more students into science and engineering careers, to improve science and engineering education at the undergraduate and graduate levels, and to foster leading research and interaction with local industry.  As such, it provides the organization and infrastructure to make various materials characterization tools available for academia and regional companies.

The BSCMC is complimentary to the Microscopy and Characterization Suite (MaCS) at the Center for Advanced Energy Studies (CAES). The MaCS is a state-of-the-art microscopy laboratory and regional resource for materials imaging in support of the CAES mission.


  • Transmission Electron Microscopy (TEM)
  • Scanning Electron Microscopy (SEM)
  • Elemental Analysis (EDS/WDS/XRF)
  • Electron Probe Microanalysis (EPMA)
  • TEM/SEM sample preperation
  • X-ray Diffraction (XRD)
  • Optical Microscopy

Location and hours of operation

Hours Location

Monday - Friday 8am to 5pm 

Micron Engineering Room 113
Boise State University
1910 University Drive
Boise, ID 83725

Links and Resources

  1. BSCMC Home Page
  2. BSCMC Laboratory Safety Manual
  3. Complete a risk assessment form before handling chemicals in this facility.
  4. iLab Customer Manual
  5. iLab PI Manual


Name Role Phone Email Location
Dr. Rick Ubic
MEC 302H
Dr. Karthik Chinnathambi
Core Manager, Research Engineer
MEC 112
Tarci Hernandez
Lab Assistant
MEC 113
Dr. Nick Bulloss
Research Engineer


Name Description
Epoxy Mount   
X-Ray Fluorescence Spectrometer (XRF) - Bruker Trace III SD 

Peltier-cooled 10 mm2 SDD
Typical resolution: 145 eV at 100,000 cps
Vacuum pump attachment for enhanced light-element sensitivity
Gas-flow chamber for the measurement of gases down to Ne

Bench top X-ray diffractometer XRD 

Priced per scan
Rigaku Miniflex 600 X-ray Diffractometer.


One dimensional D/teX Ultra high-speed detector (very quick scans),

Scintillating point detector with graphite monochromator (best for resolution),

Multiple-sample loading capability,

Zero-loss and air-sensitive sample holders.

Jet polishing 

Priced per sample
Struers Tenupol-3 Double Jet-polisher 

Ion Slicer 

Priced per sample

JEOL Model EM-09100IS Ion Slicer



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